Detector & Window Development

Be Free Windows

In 2021, Amptek announced the introduction of Boron Carbide (B₄C) windows for use with Amptek’s FAST SDD® and SiPIN detectors. The product offering is the result of a multi-year effort to provide end-users and OEM manufacturers with a high-performance window alternative to standard beryllium (Be) foils.

Some of the major advantages are listed below:

Our B4C windows have Comparable transmission efficiency to Be foils over a wide energy range, typical to hand-held and benchtop XRF applications
- Results from an instrument will not be greatly affected when switching from Beryllium to B4C windows.
- Can be used in most places where a beryllium window was previously used.
Non-toxic material provides worry-free handling during installation and use
- Concerns over the potential health hazards of beryllium and exposure are not an issue with these windows.
Less thickness variation as compared to typical Be foils
- The beryllium window forming process allows a fair amount of variation in window thickness. The tightly controlled semiconductor fabrication process on the B4C windows produces a much more consistent window thickness.
- OEM's prefer this as they can expect similar transmission from detector to detector, even at lower energies.
- Allows for better modeling in quantitative calculations if the window thickness more closely matches the nominal values.

See our Beryllium free windows page for more information!

HS Foils Acquisition

In 2016 Ametek acquired HS Foils, a provider of radiation detector components, including ultra-thin radiation windows (Si3N4), silicon drift and Si-PIN detectors, and x-ray filters. HS Foils is now part of Amptek Inc. Amptek has been using silicon nitride windows from HS Foils since 2010 and recently began shipping detectors for the EDS market using their technology.

See here for the press release.

The group has developed patented intellectual property around silicon nitride window technology which significantly expands the limits of X-ray window performance and application areas. HS Foils has extensive expertise in Si-PIN and silicon drift detector (SDD) manufacturing, producing detectors with very low leakage current, radiation hardness, and a superior front contact that provides excellent low energy resolution and uniform peak shapes.

The group’s design and production facility is at Micronova in Espoo Finland, which is the largest micro- and nanotechnology research center in Scandinavia.

This was an extremely strategic move for Amptek as it has brought detector and window design in house. Amptek is able to provide the highest quality detectors for the most demanding applications. Many different types of detectors in all shapes and sizes will soon be available from Amptek.

C-Series Silicon Nitride Windows

In 2011 The Amptek group has developed and patented a new technology for the fabrication of ultra-thin X-ray windows. The key benefit of this technology is unequaled transmission for low energy X-rays. The technology offers significant benefits compared to conventional polymer based X-ray windows. The group has developed new approaches for using traditional ceramic and crystalline materials from semiconductor industry in X-ray windows. These high quality ultra pure materials combined with an innovative X-ray window structure design, and developed fabrication methods, make it possible to manufacture ultra-thin X-ray windows with outstanding performance.

Why this technology is better:

Completely toxic free material family
The best available transmission for low energy X-rays
Large acceptance angle of the incoming X-rays.
The widest temperature range in further processing
Vacuum tightness
Pressure tolerance
Strength

Publications on window technology:

Technology development for soft X-ray spectroscopy (2016)

Performance and properties of ultra-thin silicon nitride X-ray windows (2014)

Ultra-thin silicon nitride X-ray windows (2013)

Detector Technology

The group has developed high quality, high performing, and consistent radiation detectors. Amptek uses these detectors in all its product lines. In 2018 Amptek released its 70mm² FAST SDD®, the larger area allows the collection of more x-rays and can increase accuracy and decrease run time. In 2020 Amptek released its 1mm thick detectors which allows for greater efficiency in applications where higher energy x-rays are of interest.

Si-PIN and FAST SDD® detectors with